Delay Testing: Improving Test Quality and Avoiding Over-testing
نویسندگان
چکیده
منابع مشابه
A Statistical Quality Model for Delay Testing
In this paper we introduce a statistical quality model for delay testing that reflects fabrication process quality, design delay margin, and test timing accuracy. The model provides a measure that predicts the chip defect level that cause delay failure, including marginal small delay. We can therefore use the model to make test vectors that are effective in terms of both testing cost and chip q...
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ژورنال
عنوان ژورنال: IPSJ Transactions on System LSI Design Methodology
سال: 2011
ISSN: 1882-6687
DOI: 10.2197/ipsjtsldm.4.117